Arno Schintlmeister

Topochemical analysis deals with the structural and chemical characterization of materials. Since its establishment at the University of Vienna in 2010, Arno has worked with nanometer-scale secondary ion mass spectrometry (NanoSIMS), a cutting-edge imaging technique dedicated to (ultra) trace element and high-sensitivity isotope analysis with utmost spatial resolution. Recently, he has extended analytic capacity at CeMESS with the establishment of Stimulated Raman Scattering Spectroscopy (SRS)-based imaging, coupled to fluorescence in situ hybridisation (FISH). After graduation at Innsbruck University, he spent seven years in industry (Plansee SE) before returning to academia (Technical University Vienna). Today, he enjoys performing collaborative research with colleagues from diverse fields, ranging from microbiology, biomedical sciences, geology, and materials sciences.